Infrared Thermography Recent Advances and Future Trends

Pulse and Lock-In NDT Infrared Active-Source Techniques

Author(s): Ralph A. Rotolante

Pp: 181-198 (18)

DOI: 10.2174/978160805143411201010181

* (Excluding Mailing and Handling)


Infrared Pulse and Lock-In techniques are in use for NDT applications worldwide for Defect Imaging, Stress Imaging, Solar-Cell Shunt Imaging, Solar-Cell Carrier-Density/Lifetime Imaging, and Semiconductor Photo-and Electro-Luminescence imaging. A variety of active-sources, various infrared camera types and a selection of analytical tools are available for monitoring the responses of the materials to the active-sources. This chapter presents an overview of this rich choice of NDT tools used in academia, laboratories and factories for studies of material types ranging from composites, metals, ceramics, polymers and concrete, to semiconductors, solar cells, bones, leather and cheese, and projects strong future growth for the technology.

Keywords: NDT, infrared, thermography, lock-in, transient, flash, stress, delamination, cracks, shunts, photoluminescence, electroluminescence, LIT, vibrothermography, defects.

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