Nano-FET Devices: Miniaturization, Simulation, and Applications (Part 1)

From CMOS to TFET: Technological Scalability and Performance Concerns Pertaining to Moore's Law

Author(s): Girdhar Gopal* and Tarun Varma

Pp: 36-82 (47)

DOI: 10.2174/9789815313802125010006

* (Excluding Mailing and Handling)

Abstract

Moore's law has contributed to a significant factor behind the ongoing shrinking of transistors in CMOS technology since its inception in the 1960s. Dennard et al.'s scaling theory from 1974 illustrates how cost, performance, and power can be enhanced in solid-state devices while maintaining fundamental MOSFET operating characteristics. In the past, the regulation of dynamic power was governed by Moore's law. However, as leakage increases with decreasing geometries, quiescent power consumption becomes the predominant factor in microprocessor design. Short channel issues like DIBL, SS, and hot electron effect may all have a detrimental influence on MOS device performance. Because of these effects, CMOS technology has hurdles, and TFETs may overcome SS limits, making them a promising option for low-power standby uses. Finally, we discuss the possibilities beyond CMOS technology, detailing the difficulties and prospects for technological advancement. This chapter gives a brief summary of current developments in device development with an emphasis on Tunnel FETs for upcoming circuits.


Keywords: CMOS, MOSFET, TFET, Transistors.

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